X-Ray Diffraction Studies of Undoped and in-Doped Cd0.22Zn0.78S Films Deposited by Spray Pyrolysis

Authors : Saliha İlican, Yasemin And Müjdat ÇAĞLAR, Saliha ILICAN, Yasemin ÇAĞLAR, Müjdat ÇAĞLAR

Pages : 85-94

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Publication Date : 2005-08-01

Article Type : Research Paper

Abstract :Cd0.22Zn0.78S and In-doped Cd0.22Zn0.78S films have been produced by the spray pyrolysis method at 275±5°C substrate temperature. This work describes the X-ray diffraction spectra of all films at room temperature. X-ray diffraction spectra of the films showed that they are hexagonal and formed as Cd0.22Zn0.78S polycrystalline structure. Film thickness, texture coefficient insert ignore into journalissuearticles values(TC);, grain size values, lattice constants, and d% error were calculated. Effects of Indium incorporation on these properties deposited films have been systematically investigated.
Keywords : Cadmium Zinc Sulfide, Indium Doping, Spray Pyrolysis, X Ray Diffraction Spectra, Texture Coefficient, Grain Size