OPTICAL VIBRATIONAL AND MORPHOLOGICAL PROPERTIES OF S-Co3O4 NANOSTRUCTURED THIN FILM

Authors : Tülay Hurma

Pages : 388-397

Doi:10.18038/aubtda.295720

View : 9 | Download : 6

Publication Date : 2017-06-30

Article Type : Research Paper

Abstract :Sulphur doped Co 3 O 4 insert ignore into journalissuearticles values(S-Co 3 O 4 ); nanostructured thin film has been produced by ultrasonic spray pyrolysis insert ignore into journalissuearticles values(USP); method. The film has been characterized by X-ray diffraction insert ignore into journalissuearticles values(XRD);, energy-dispersive X-ray spectroscopy insert ignore into journalissuearticles values(EDAX);, Fourier transform infrared insert ignore into journalissuearticles values(FT-IR); and Raman spectroscopy. The surface appearance of the film was obtained using scanning electron microscope insert ignore into journalissuearticles values(SEM);. Optical reflectance and transmittance spectra were recorded with a double beam spectrophotometer equipped with an integrating sphere. The optical constants such as refractive index, extinction coefficient, optical conductivity, real and imaginary parts of the dielectric constant of the film were calculated. The XRD pattern shows that the film has only clear diffraction peaks around 2θ = 29.26 o corresponding to the insert ignore into journalissuearticles values(111); plane of cubic Co 3 O 4 . The crystallite size was calculated to be approximately 24 nm. The Raman measurements revealed four peaks of Co 3 O 4 . Infrared spectrum of the film has been investigated in 500–3000 cm −1 region.
Keywords : S doped Co3O4, XRD, Optical constant, FT IR, Raman