Determination of Optical Constant of Materials by two Different Methods: An Application to Single Crystals Si

Authors : Haziret DURMUŞ, Haluk ŞAFAK, Haldun KARABIYIK

Pages : 725-735

View : 8 | Download : 6

Publication Date : 0000-00-00

Article Type : Research Paper

Abstract :The normal reflectance of single crystal Si was measured at 0.5 ­5.6 eV range by unpolarized light. Optical parameters of Si were determined from this reflectance data by using two different methods: oscillator fit procedure and Kramers-Kronig analysis. The refractive index, extinction coefficient and the real and imaginary parts of complex dielectric constant obtained by these two methods were compared. A good agreement was found between two methods. Furthermore, the optical parameters so obtained seem to be in a satisfactory agreement with the literature.
Keywords : Optical Constant, Si Single Crystals, Oscillator Fit Procedure, Kramers Kronig Analysis