Structural Defects and Electrical Properties of Extruded Samples of Bi85Sb15 Solid Solutions

Authors : Farkhad SAMEDOV, Mail TAGIEV

Pages : 131-138

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Publication Date : 0000-00-00

Article Type : Research Paper

Abstract :The effect of 5 hours annealing in vacuum \sim 10-3 Pa at 503 K on the electroconductivity insert ignore into journalissuearticles values(s);, the coefficient of thermoelectric power insert ignore into journalissuearticles values(a); and the Hall coefficient insert ignore into journalissuearticles values(Rx); for extruded samples of Bi85Sb15 has been investigated in the temperature range from \sim 77 K up to \sim 300 K. The samples were taken with a different concentration of Pb insert ignore into journalissuearticles values(lead); up to \sim 0.1 a.w %. The anisotropy of electrical properties of these samples was also studied in the temperature range between 77 K and 300 K and in the presence of magnetic field up to \sim 74 \times 104 A/m. It is established that unannealed samples are nearly insensitive to the amount of lead and to the strength of the applied magnetic field. With increasing the amount of Pb we observed inversion of signs of a and Rx from n to p-type. The obtained results are interpreted within the assumption that the extrusion of Bi85 Sb15 samples may give rise to a creation of deformation defects which act as scattering centers for electrons and disappear with annealing.
Keywords : Turk J Phys, 22, 1998, , 131 138 Turk J Phys, vol 22, iss 2