Low-temperature Cr(III)OCI: X-ray powder diffraction patterns

Authors : R. E. SOWDEN

Pages : 0-0

Doi:10.1501/Commub_0000000533

View : 19 | Download : 4

Publication Date : 1978-01-01

Article Type : Research Paper

Abstract :The crystal structure of high-temperature Cr insert ignore into journalissuearticles values(III); 0C1 is kno.wn but nevertheless there exist no previously published X-ray diffraction data suitable for routine Identifi¬cation purposes. In the present work Cr insert ignore into journalissuearticles values(III); OC1 was prepared free from crystalline Cr2O3 at the relatively low temperature of 590°C by reacting dried chromic hydrate with anhydrous CrCI3. Low-temperature samples of Cr insert ignore into journalissuearticles values(III); OC1 prepared using low-temperature and high temperature CrCl3 were examined with a Guinier camera. The X-ray powder diffraction pattern of the former sample of Cr insert ignore into journalissuearticles values(III); OC1 was also indexed in the range 20—10-63° with a diffractometer. The three strongest lines observed were 7.67 dA insert ignore into journalissuearticles values(100 I /Io);, 3.441 insert ignore into journalissuearticles values(100); and 2.441 insert ignore into journalissuearticles values(60);. The X-ray powder diffraction data obtained, along with previously unpublished reference data for high-teperature Cr insert ignore into journalissuearticles values(III); OC1, are tabulated in a form suitable for ro¬utine Identification purposes
Keywords : Low temperature, X ray powder, diffraction patterns