Measurement of K Level Natural Line Widths, Kα1 and Kα2 X-Ray Line Widths

Authors : Ömer SÖĞÜT

Pages : 837-848

Doi:10.18185/erzifbed.927078

View : 13 | Download : 4

Publication Date : 2021-08-31

Article Type : Research Paper

Abstract :In this study, the K shell natural line widths with K1 and K2 X-ray line widths of Ti, V, Cr, Mn, Fe, Co, Ni, Cu and Zn elements and compounds were semi-experimentally calculated by using the values of K shell fluorescence yield. An 241Am radioisotope source, emitting in 75 mCi intensity and 59.5 keV energy gamma rays was used to stimulate the samples. A solid state Si(Li) detector have a resolution 155 eV at 5.96 keV, was used to count K X-rays emitted from the specimens. It was determined that the X-ray line widths of ΓK1 and ΓK2 and the natural line width of the ΓK K level vary depending on the chemical structure. The results show that ΓK, ΓK1 and ΓK2 line widths measured in compounds deviated up to 5-48% from according to values of the pure element. The present results, for pure elements, are in good agreement with the results of other researchers in the literature within the limits of error.
Keywords : K X rays, chemical effect, fluorescence yield, line width