Programming the Measurement System by using VEE Pro to Determine Cyclic I-V Characteristics: Resistive Switching Device Application

Authors : Ersin TEMEL, Abdullah AKKAYA

Pages : 110-119

Doi:10.18185/erzifbed.1168992

View : 9 | Download : 5

Publication Date : 2023-03-31

Article Type : Research Paper

Abstract :In this study we introduce a simple program for cyclic current–voltage insert ignore into journalissuearticles values(I–V); measurements for bipolar and unipolar resistive switching devices. This program insert ignore into journalissuearticles values(Cyclic I-V, CYC-IV); was developed under the Keysight VEE Pro insert ignore into journalissuearticles values(Visual Engineering Environment Program); software and has a graphical interface. CYC-IV was developed for programming the Keysight B2912 Precision Source/Measure Unit insert ignore into journalissuearticles values(SMU); for I-V measurement of resistive switching devices in sweep mode. CYC-IV can be used in six different sweep mode. Moreover, the ramp rate, upper and lower limits of bias, cycle delay time and number of cycles easily define by user. Measurement results were visualized in three graphs that can be viewed simultaneously with the measurements.
Keywords : cyclic I V, sweep mode, VEE Pro, resistive switching devices, SMU